2006 research papers
H.S. Djie, D.-N. Wang, B.S. Ooi, J.C.M. Hwang, X.-M. Fang, Y. Wu, J.M. Fastenau, and W.K. Liu, "Intermixing of InGaAs Quantum-dots Grown by Cycled Monolayer Deposition", J. Appl. Phys. 100, 033527, (2006).
N. Parthasarathy, Z. Griffith, C. Kadow, U. Singisetti, M.J.W. Rodwell, X.-M. Fang, D. Lubyshev, Y. Wu, J.M. Fastenau, and A.W.K. Liu, "Collector-Pedestal InGaAs/InP DHBTs Fabricated in a Single-Growth, Triple-Implant Process", IEEE Electron Device Letts. 27, 313 (2006).
E. Lind, Z. Griffith, M.J.W. Rodwell, X.-M. Fang, D. Lubyshev, Y. Wu, J.M. Fastenau, and A.W.K. Liu, "250 nm InGaAs/InP DHBTs w/ 650 GHz fmax and 420 GHz ft, Operating Above 30 mW/mm2", 64th Device Research Conference, Penn State University, PA, June 26-28, 2006.
Z. Griffith, M.J.W. Rodwell, X.-M. Fang, D. Lubyshev, Y. Wu, J.M. Fastenau, and A.W.K. Liu, "In0.53G0.47aAs/InP DHBTs with a 75 nm Collector, 20 nm Base Demonstrating 544 GHz ft, BVCEO = 3.1 V, and BVCBO = 3.4 V", 18th International Conference on InP and Related Materials, Princeton, NJ, May 8-11, 2006, MB-2.5.
R T Blunt, "White Light Interferometry - A production worthy technique for measuring surface roughness on semiconductor wafers". 2006 Int. Conf. on Compound Semiconductor Manufacturing Technology, Vancouver BC, Canada, April 24 - 27, 2006.
R T Blunt, "Interferometry speeds surface roughness analysis". Compound Semiconductor, June 2006 12(5) 18 - 21 (2006).